NanoTerasu Coalition Beamlines: Selection Guide

Effectively solving development challenges often requires combining multiple beamlines and integrating simulations (MD, FEM, etc.).
For materials like polymers, a stepwise approach starting with rapid, reliable measurements (SAXS/WAXS) is frequently the most efficient path.
For guidance on method selection or advanced analysis, please consult our concierge.

At the NanoTerasu Coalition Beamlines, you can investigate properties such as structure, elements, chemical states, electronic states, internal geometry, and magnetic states of materials depending on your objectives. For those unfamiliar with synchrotron experiments, it is easier to start by choosing a beamline based on "what you want to know about your sample."

Selection Workflow

Selecting a NanoTerasu beamline (BL) is smoothly narrowed down in two steps: "Information of Interest" and "Physical Constraints of the Sample."

STEP 1: Narrowing down by physical constraints (Filter)

First, check which of the following conditions applies to your sample.

Item Soft X-ray Region (BL07U, 08U, 14U) Tender/Hard X-ray Region (BL08W, 09U, 09W, 10U)
Target Elements Light elements (C, N, O, etc.), 3d transition metals Medium to heavy elements, tender region (S, P, Si, Ca, etc.)
Penetration/Thickness Very low penetration. Target: surface (a few nm) or ultra-thin films (~100 nm). High penetration. Target: bulk (internal), solutions, thick specimens.
Environment UHV is generally required. (BL08U allows gas atmosphere) In-air, liquids, heating/pressurization are relatively easy to control.
Beam Size & Res. Strong in local analysis with nano-focusing (< 100 nm). Wide range from µm to mm, or 3D observation with high spatial resolution.

STEP 2: Select BL based on the level of information

Choose the optimal BL based on the physical quantities or phenomena of interest.
2D: In-plane distribution / microspectroscopy (mapping)
3D: 3D structure / CT (tomography)
Adv.: Advanced measurements often require support/joint research with academic researchers who introduced the equipment. Please consult with the concierge for details.

Information Level Target Specific Measurement Method / Device Applicable Beamline
① Magnetism & Spin Magnetic domains, magnetic devices, magnetic anisotropy STXM / SXM (XMCD) 2D Adv. BL14U
Non-focusing XAS (XMCD) BL14U
RIXS (Spin excitation) Adv. BL07U
ARPES (Spin analysis) Adv. BL07U
② Electronic/Chemical States Valence, chemical bonding, band structure, electron correlation ARPES / RIXS Adv. BL07U
Nano-ESCA Adv. BL07U
AP-XPS / Operando SX-XAFS Adv. BL08U
HAXPES (Hard X-ray Photoelectron Spectroscopy) BL09U
XAFS / Non-focusing XAS BL08W / BL14U
③ Element Distribution Elemental mapping, concentration distribution, heterogeneity STXM / SXM 2D Adv. BL14U
XRF (X-ray Fluorescence) 2D BL08W
Absorption Edge Difference CT 3D BL10U
④ Protein 3D Structure Single crystal analysis, microcrystals MX-ES 3D BL09U
⑤ Atomic/Crystal Structure Crystal phase, lattice constant, orientation, thin film structure Powder XRD / Surface XRD BL08W
⑥ Particle Size/Aggregation/Orientation Particle size distribution, molecular orientation, aggregation, self-assembly, voids SAXS / WAXS / GISAXS BL08W
⑦ 3D/4D Morphology/Failure 3D/4D shape, voids/cracks, heterogeneous mixing, fracture, dynamic changes Monochromatic Synchrotron CT 3D
Ptychography 3D Adv.
BL10U
White Synchrotron CT 3D
White Synchrotron CT 4D Adv.
BL09W

How to choose CT

For non-destructive internal observation, BL09W offers fast white X-ray CT (15 mins/scan), while BL10U is better for high-resolution or phase-contrast monochromatic CT.

Basics of SAXS Data Interpretation

A structural atlas that simulates scattering profiles for typical cases obtained from SAXS (Small-Angle X-ray Scattering) and explains the basic structural information (particle size, aggregation, etc.) that can be read from them.
We hope this will serve as a helpful resource for those considering the use of SAXS for the first time.

Back to Beamline List