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Experimental Techniques

Overview

This beamline utilizes monochromatic X-rays obtained by a double-crystal monochromator with an undulator as the light source. It covers the tender to hard X-ray energy range; however, the energy is fixed at 6 keV for HAXPES measurements.

Beam Characteristics

  • Energy 5~15 keV
  • Flux 3.7x1012~7x1013 cps (Calculated value, depends on energy and experimental conditions)
    * Al filters for adjusting light intensity are installed inside experimental hutch 3. (Users can freely combine and select from 50 μm, 100 μm, and 150 μm thicknesses.)
    Flux Adjustment
  • Beam size • Value obtained by measurement with a Au 30 μmΦ wire.
    TOA=0° < 12.5 μm(H) x 3 μm(V)
    TOA=88° < 360 μm(H) x 3 μm(V)

Hutch size

Approx. 9.5 m (along the beam axis) x 4.5 m (width) x 4 m (height)

Light Source and Optics

This beamline utilizes a 166-pole, 22 mm period in-vacuum undulator as its light source, and a monochromatic X-ray beam is available after passing through a liquid nitrogen-cooled Si(111) double-crystal monochromator. A double-mirror system for harmonic rejection is installed in the experimental hutch. Downstream, a channel-cut crystal and a Wolter mirror are installed.

Experimental Station

Experimental Equipment: [Hard X-ray Photoemission Spectroscopy (HAXPES) system]

Detector: [Scienta Omicron electron analyzer]

About Samples

  • Sample size: Max. 16 mm (height) x 14 mm (width) (thickness: 2.5 mm or less)
  • *If the sample thickness is 2.5 mm or more, a different sample transfer method will be required. Please consult with your assigned concierge or the beamline staff before submitting your reservation request.
  • Sample carrier size: 16 mm (height) x 14 mm (width)
  • Example of sample mounting (Si substrate): 7 mm (height) x 7 mm (width) x 0.65 mm (thickness)
Carrier Size Mounting Example

Samples are fixed using carbon tape.
Note: Measurements may not be successful for non-conductive samples. Please consider applying a conductive coating (e.g., metal deposition) to the sample surface to ensure conductivity.

Note: By cutting the sample size to approximately 4 mm (height) x 10 mm (width), it is possible to mount three samples on one sample carrier.
Note: The manipulator in the main chamber can hold five sample carriers.

Regarding Charge-up Mitigation

The sufficient coating thickness for charge-up mitigation using carbon coating was investigated. A carbon coating thickness of around 10 nm is recommended.

Spectrum Wide Spectrum Si1s Spectrum O1s

Regarding sample prepared under inert atmosphere

Sample transfer without exposure to the atmosphere is possible using a transfer vessel. Up to five sample carriers prepared as described above can be loaded simultaneously. (Sample thickness: 2.5 mm or less)

Regarding sample carriers

Due to the limited number of sample carriers, we do not offer pre-rental. If you require sample carriers for pre-sample preparation, it will be necessary for each user to have them manufactured. The sample carrier drawing is as follows (Click to display as a PDF).

Sample carrier (plate)

Carrier Plate Drawing

Sample carrier (base)

Carrier Base Drawing

Note: M2-8 countersunk screws are required to fix the above carrier (4 screws per carrier).

Layout