Experimental Techniques

• Resonant inelastic soft X-ray scattering
• Nanoscale spin- and angle-resolved photoemission spectroscopy
• Nanoscale scanning X-ray photoelectron spectroscopy
• Soft X-ray photoelectron spectroscopy
• Soft X-ray absorption spectroscopy

Overview

BL07U is a beamline designed for analyzing the electronic states of materials using soft X-rays in the energy range of 50 to 2000 eV. Soft X-rays with horizontal and vertical linear polarization, as well as left- and right-circular polarization, are generated using an APPLE-II–type elliptical undulator inserted in the storage ring. BL07U employs an optical system with no energy dependence on the deflection angle or divergence. A nanoscale scanning X-ray photoelectron spectroscopy system (named nano-ESCA) [1], a nanoscale spin- and angle-resolved photoemission spectroscopy system (named SCORPIUS: Soft X- ray Complete OpeRando PhotoemIssion UltramicroScopy) and a resonant inelastic X-ray scattering system (named HORNET) [2] are installed at the beamline.

[1] K. Horiba et al., Rev. Sci. Instrum. 82, 113701 (2011).
[2] Y. Harada et al., Rev. Sci. Instrum. 83 (1), 013116 (2012).

Beam Characteristics

Energy Range

  50 - 2000 eV  (horizontal linear polarization)
  86 - 2000 eV  (vertical linear polarization)
  50 - 1000 eV  (left- and right- circular polarization)
850 - 2000 eV  (left- and right- elliptical polarization)

Flux

> 1 × 10¹² photons/s   (calculated value, depends on energy and experimental conditions)

Light Source and Optics

The light source is a 53-pole, 75 mm period APPLE-II–type elliptical undulator, and monochromatic soft X-ray beams are obtained using a grating monochromator.

Experimental Station

« HORNET » (RIXS station)

Measurement Methods

·Resonant inelastic soft X-ray scattering

·X-ray absorption spectroscopy (total electron yield and partial fluorescence yield)

Beam Size

·Approx. 20 ㎛  (horizontal) × 1 ㎛ (vertical)

Samples

· Solid, liquid, and gas samples (supported with appropriate sample environments)

· Sample mounting guidelines

Measurement Examples

· Measurement examples @ HORNET

« NanoESCA » (nanoscale scanning XPS station)

Measurement Methods

·Scanning X-ray photoelectron spectroscopy

·X-ray photoelectron spectroscopy

·Resonant photoemission spectroscopy

·X-ray absorption spectroscopy (total electron yield and Auger electron yield)

Beam Size

·1 ㎜ × 1 ㎜ (direct beam, FZP out)

·Approx. 100 ㎚ diameter (FZP in)

Samples

·Electrically conductive solids with near-surface ( < 2 ㎚) observation targets.

·Sample mounting guidelines

Measurement Examples

· Measurement examples @ NanoESCA

« SCORPIUS » (nanoscale spin- and angle-resolved PES station)

Measurement Methods

· Spin- and angle-resolved photoemission spectroscopy

· X-ray photoelectron Spectroscopy

· Ultraviolet photoelectron spectroscopy

· X-ray absorption spectroscopy (total electron yield)

Technical Specifications

·Soft X-ray Complete OpeRando PhotoemIssion UltramicroScopy(SCORPIUS)

Layout

Specialized Measurements under a Joint Research Framework

The following measurements are available subject to a joint research agreement:
HORNET station
· Resonant inelastic X-ray scattering
· Measurements of liquid and gas samples using a solution cell
nano-ESCA station
· Nanoscale measurements using a Fresnel zone plate

Operando measurements of devices such as transistors and batteries can also be performed using these stations.
For further details, please contact Professor Yoshihisa Harada at the Institute for Solid State Physics, The University of Tokyo.

Links
Synchrotron Radiatiom Science YOSHIHISA HARADA LAB.
The Institute For Solid State Physics Synchrotron Orbit Radiation HARADA LAB.

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