BL07U

Experimental Techniques

• Standard Measurement
• Soft X-ray Absorption Spectroscopy (XAS) – using RIXS equipment
• Soft X-ray Photoelectron Spectroscopy (XPS) – using NanoESCA equipment
• Angle-Resolved Photoemission Spectroscopy (ARPES) – using SCORPIUS equipment
• Advanced Measurement
• Resonant Soft X-ray Inelastic Scattering (RIXS)
• Nano-scale X-ray Photoelectron Spectroscopy (NanoESCA)
• Multimodal Operando Microspectroscopy (SCORPIUS *Under development)

Overview

BL07U is a beamline designed for analyzing the electronic states of materials using soft X-rays in the energy range of 50 to 2000 eV. Soft X-rays with horizontal and vertical linear polarization, as well as left- and right-circular polarization, are generated using an APPLE-II–type elliptical undulator inserted in the storage ring. BL07U employs an optical system with no energy dependence on the deflection angle or divergence. A nanoscale scanning X-ray photoelectron spectroscopy system (named nano-ESCA) [1], a nanoscale spin- and angle-resolved photoemission spectroscopy system (named SCORPIUS: Soft X-ray Complete OpeRando PhotoemIssion UltramicroScopy) and a resonant inelastic X-ray scattering system (named HORNET) [2] are installed at the beamline.

[1] K. Horiba et al., Rev. Sci. Instrum. 82, 113701 (2011).
[2] Y. Harada et al., Rev. Sci. Instrum. 83 (1), 013116 (2012).

Beam Characteristics

• Energy Range ・50 - 2000 eV (horizontal linear polarization)
  ・86 - 2000 eV (vertical linear polarization)
  ・50 - 1000 eV (left- and right- circular polarization)
  ・850 - 2000 eV (left- and right- elliptical polarization)
• Flux > 1 × 10¹² photons/s (calculated value, depends on energy and experimental conditions)

Light Source and Optics

The light source is a 53-pole, 75 mm period APPLE-II–type elliptical undulator, and monochromatic soft X-ray beams are obtained using a grating monochromator.

Experimental Station

« HORNET » (RIXS station)

• Measurement Methods ・Resonant inelastic soft X-ray scattering [Advanced]
  ・X-ray absorption spectroscopy (total electron yield and partial fluorescence yield) [Standard]
• Beam Size ・Approx. 20 μm (horizontal) × 1 μm (vertical)
• Samples ・Solid, liquid, and gas samples (supported with appropriate sample environments)
  ・Sample mounting guidelines
• Examples ・Measurement examples @ HORNET

« NanoESCA » (nanoscale scanning XPS station)

• Measurement Methods ・Scanning X-ray photoelectron spectroscopy [Advanced]
  ・X-ray photoelectron spectroscopy [Standard]
  ・Resonant photoemission spectroscopy [Standard]
  ・X-ray absorption spectroscopy (total electron yield and Auger electron yield) [Standard]
• Beam Size ・1 mm × 1 mm (direct beam, FZP out)
  ・Approx. 100 μm diameter (FZP in)
• Samples ・Electrically conductive solids with near-surface (< 2 nm) observation targets.
  ・Sample mounting guidelines
• Examples ・Measurement examples @ NanoESCA

« SCORPIUS » (nanoscale spin- and angle-resolved PES station)

• Measurement Methods ・Angle-resolved photoemission spectroscopy (ARPES) [Standard]
  ・Spin- and angle-resolved photoemission spectroscopy (SARPES) [Advanced]
  ・X-ray photoelectron Spectroscopy [Standard]
  ・Ultraviolet photoelectron spectroscopy [Standard]
  ・X-ray absorption spectroscopy (total electron yield) [Standard]
• Technical Specs ・Soft X-ray Complete OpeRando PhotoemIssion UltramicroScopy(SCORPIUS)

Layout

Specialized Measurements under a Joint Research Framework

The following measurements are available as advanced measurements subject to a joint research agreement:
HORNET station
・Resonant inelastic soft X-ray scattering
・Measurements of liquid and gas samples using a solution cell
nano-ESCA station
・Nanoscale measurements using a Fresnel zone plate and nanoscale imaging
SCORPIUS station
・Multimodal operando microspectroscopy (*Under development)

Operando measurements of devices such as transistors and batteries can also be performed using these stations.
For further details, please contact Professor Yoshihisa Harada at the Institute for Solid State Physics, The University of Tokyo.