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The Photon Science Innovation Center provides users with measurement instruments known as beamlines.

Beamline Specifications

Beamline Map
Beamline Measurement Method Measurement Method (Advanced)
BL07U Soft X-ray Absorption Spectroscopy (XAS), Soft X-ray Photoelectron Spectroscopy (XPS), Angle-Resolved Photoemission Spectroscopy (ARPES) Resonant Soft X-ray Inelastic Scattering (RIXS), Nano-scale X-ray Photoelectron Spectroscopy (NanoESCA), Multimodal Operando Microspectroscopy (SCORPIUS)
BL08U Soft X-ray Absorption Spectroscopy (XAS), Soft X-ray Photoelectron Spectroscopy (XPS) Ambient Pressure Photoelectron Spectroscopy (AP-XPS), Operando Soft X-ray Absorption Fine Structure (operando SX-XAFS), Soft X-ray absorption, fluorescence, and resonance imaging (SAFARI *under development)
BL08W_XRD Powder X-ray Diffraction, 2D X-ray Diffraction Mapping, Surface X-ray Diffraction, In-situ X-ray Diffraction, Elemental Mapping by X-ray Fluorescence -
BL08W_SAXS Small-Angle X-ray Scattering (SAXS), Wide-Angle X-ray Scattering/Diffraction (WAXS), Grazing Incidence SAXS (GI-SAXS) -
BL08W_XAFS Tender X-ray XAFS, Hard X-ray XAFS -
BL09U HAXPES (Hard X-ray Photoelectron Spectroscopy) MX-ES (Macromolecular Crystallography End Station)
BL09W White wide-field CT, White μ-CT 4D-CT
BL10U Monochromatic μ-CT, Ultra-Small-Angle SAXS (USAXS), Ambient SAXS XPCS, X-ray Ptychography
BL14U Soft X-ray Absorption Spectroscopy (XAS), Soft X-ray Magnetic Circular Dichroism (XMCD) Soft X-ray Imaging SXM, STXM