Beamline information
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Beamline specifications
Link to each Beamline Information
| Beamline | Measurement Method | Measurement Method (Advanced) |
| BL07U |
Soft X-ray absorption spectroscopy (XAS)， Soft X-ray photoelectron spectroscopy (XPS) |
Resonant inelastic soft X-ray scattering (RIXS)， Nano X-ray photoelectron spectroscopy (NanoESCA) |
| BL08U |
Soft X-ray photoelectron spectroscopy (XPS)， Soft X-ray absorption fine structure (SX-XAFS) |
Ambient soft X-ray photoelectron spectroscopy (AP-XPS)， Operando soft X-ray absorption fine structure (Operando SX-XAFS) |
| BL08W_XRD |
X-ray powder diffraction Two-dimensional X-ray diffraction mapping |
Surface X-ray diffraction， In-situ X-ray diffraction |
| BL08W_SAXS |
Small angle X-ray scattering， Wide angle X-ray scattering and diffraction， Grazing incidence Small angle and wide angle scattering and diffraction |
|
| BL08W_XAFS |
Tender X-ray XAFS， Hard X-ray XAFS |
|
| BL09U | Hard X-ray Photoelectron Spectroscopy (HAXPES) | |
| BL09W |
White X-ray CT， White X-ray Imaging |
4D-CT |
| BL10U | Monochromatic X-ray CT |
Microbeam fluorescence mapping， USAXS， XPCS， X-ray Ptychography |
| BL14U |
Soft X-ray absorption spectroscopy (XAS)， Soft X-ray magnetic circular dichroism spectroscopy (XMCD) |
Soft X-ray Imaging SXM, STXM |