Overview

The nanoscale spin- and angle-resolved photoemission spectroscopy system, developed by the National Institute for Materials Science (NIMS), is used to analyze electronic and chemical states in solids. By using a focusing mirror, the light can be focused down to 1 μm or less on the sample. Using a Fresnel zone plate (FZP), the light can be focused to approximately 100 nm. The use of focused light makes it possible to analyze not only homogeneous samples but also small-scale, polycrystalline, and combinatorial samples. Advanced measurements, which require a joint research agreement, are available for angle-resolved photoemission spectroscopy (ARPES), spin-resolved ARPES (SARPES), nanoscale measurements, and operando measurements. The system supports both measurements under static conditions and measurements under operating conditions (operando measurements), and can be used for a wide range of materials, including semiconductors, spintronic materials, battery materials, and thermoelectric materials.
(Note) The values above are design values and may differ from the actual values.

Experimental Techniques

XPS,   UPS,   XAS,   ARPES,   SARPES

Sample

*Maximum 5 ㎜ × 5 ㎜ (thickness: several ㎜)
*Electrically conductive solids with near-surface ( < 2 ㎚) observation targets.
*Does not adversely affect the ultra-high vacuum environment

Start of Operations:

Operations were initially planned to begin in May 2025, but it has become clear that more time is required for alignments. Therefore, we now plan to commence operations gradually starting in October. The measurement that will be available from October is planned to be XPS using a non-focused beam.
We will inform you of the more detailed schedule for the start of operations as soon as it is finalized.