Overview

The new "Soft X-ray Multimodal Operando Micro-Spectroscopy Equipment" to be introduced by the National Institute for Materials Science (NIMS) will allow for the analysis of the electronic and chemical states of solids. By using a focusing mirror, light focused down to 1 μm or less on the sample can be utilized, and by using a Fresnel zone plate, light focused down to Φ100 nm or less on the sample can be utilized. The use of focused light enables the analysis of not only homogeneous, fine, polycrystalline and combinatorial samples. XPS, UPS, XAS are planned as standard measurements, and ARPES, SARPES, nano-focused measurement, and operando measurement are planned as advanced measurements. Both steady-state measurements and measurements under operating environments are possible for materials such as semiconductor materials, spintronic materials, battery materials, and thermoelectric materials.
(Note) The values above are design values and may differ from the actual values.

Experimental Techniques

XPS,   UPS,   XAS,   ARPES,   SARPES

Sample dimensions

*Maximum 5 mm × 5 mm (thickness: several mm)

Sample

*Solid material (conductive, with the observation target located within 2 nm of the surface)
*Does not adversely affect the ultra-high vacuum environment

Start of Operations:

Operations were initially planned to begin in May 2025, but it has become clear that more time is required for alignments. Therefore, we now plan to commence operations gradually starting in October. The measurement that will be available from October is planned to be XPS using a non-focused beam.
We will inform you of the more detailed schedule for the start of operations as soon as it is finalized.